About Us

The Materials Characterization and Metrology Center is well-equipped with the tools and expert support needed to assist with material imaging and chemical analysis.

If you have a question about our services, have a concern, or require assistance, please don't hesitate to reach out to our team.

Richard Chung
Center Director
Professor and Chair, Chemical and Materials Engineering
[email protected]

Christina Peters
Center Accounts Manager
Scanning Electron Microscopy (SEM) liaison
Adjunct Professor, Chemical and Materials Engineering
[email protected]

Craig England
X-Ray Diffraction (XRD) liaison
Adjunct Professor, Chemical and Materials Engineering
[email protected]

Michel Goedert
Atomic Force Microscopy (AFM) liaison
Adjunct Professor, Chemical and Materials Engineering
[email protected]

John Lee
Optical Profilometry liaison
Professor, Mechanical Engineering
[email protected]